WLP 2000 Wafer Level Package Direct Writing Lithography System
Product Features
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Equipped with Die shifts smart compensation,RDL intelligent pattern distribution, real-time auto focus、edge exposure WEE/WEP, backside alignment function

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Support CFMEE one-stop solution which includes metrology, exposure, and inspection

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Support wafer size:
12"与8"

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Minimum lines & spaces:
2μm

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Overlay accuracy:
±0.6μm

*The above data is derived from the test results of CFMEE laboratory, and the specific situation may vary depending on the actual use environment. The company reserves the right to adjust the relevant data and content without prior notice.
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Service Hotline: +86-400-8935-098
Service Consultation: sales@cfmee.cn